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electron backscatter diffraction ebsd detector  (Gatan Inc)


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    Structured Review

    Gatan Inc electron backscatter diffraction ebsd detector
    <t>EBSD</t> microstructures of Cr-Ni-Mo-V steel at different tempering temperatures: ( a ) 425 °C; ( b ) 475 °C; ( c ) 525 °C; ( d ) 575 °C; ( e ) 625 °C; ( f ) proportion of HAGBs.
    Electron Backscatter Diffraction Ebsd Detector, supplied by Gatan Inc, used in various techniques. Bioz Stars score: 96/100, based on 621 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
    https://www.bioz.com/product/electron+backscatter+diffraction+ebsd+detector/Velocity/pmc13164498-84-38-43
    Average 96 stars, based on 621 article reviews
    electron backscatter diffraction ebsd detector - by Bioz Stars, 2026-09
    96/100 stars

    Images

    1) Product Images from "Effect of Tempering Temperature on Microstructural Evolution and Mechanical Properties of Cr-Ni-Mo-V Steel for Pressure Vessel Applications"

    Article Title: Effect of Tempering Temperature on Microstructural Evolution and Mechanical Properties of Cr-Ni-Mo-V Steel for Pressure Vessel Applications

    Journal: Materials

    doi: 10.3390/ma19091679

    EBSD microstructures of Cr-Ni-Mo-V steel at different tempering temperatures: ( a ) 425 °C; ( b ) 475 °C; ( c ) 525 °C; ( d ) 575 °C; ( e ) 625 °C; ( f ) proportion of HAGBs.
    Figure Legend Snippet: EBSD microstructures of Cr-Ni-Mo-V steel at different tempering temperatures: ( a ) 425 °C; ( b ) 475 °C; ( c ) 525 °C; ( d ) 575 °C; ( e ) 625 °C; ( f ) proportion of HAGBs.

    Techniques Used:

    Related Articles

    other:

    Article Title: Rapid preparation of Ni–Mn–Sn–Co lattice through material extrusion additive manufacturing and sintering
    Article Snippet: Microstructural analysis was performed using scanning electron microscopes (SEMs; Sigma 300, Zeiss, Germany, and Apreo 2C, Thermo Scientific, USA) and an electron backscatter diffraction (EBSD) detector (Velocity Super, EDAX, USA).

    Article Title: Effect of Tempering Temperature on Microstructural Evolution and Mechanical Properties of Cr-Ni-Mo-V Steel for Pressure Vessel Applications
    Article Snippet: For orientation and grain boundary analysis, specimens were electropolished in a 5% perchloric acid–ethanol solution at 15 V for 50 s. The crystal orientation and grain boundary distribution of the experimental steel were analyzed by means of an electron backscatter diffraction (EBSD) detector (EDAX Velocity Super) (EDAX LLC, Mahwah, NJ, USA), and the data acquisition step was 0.2 μm.

    Microscopy:

    Article Title: Temperature-dependent mechanical behavior of aluminum AM structures generated via multi-layer friction surfacing
    Article Snippet: .. The grain size of deposited material was analyzed in representative region of the MLFS stack using a scanning electron microscope (SEM) (Quanta 650, Thermo Fisher Scientific Inc., USA) equipped with an EDAX electron backscatter diffraction (EBSD) detector of the Velocity series (AMETEK Inc., USA). ..



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    Image Search Results


    EBSD microstructures of Cr-Ni-Mo-V steel at different tempering temperatures: ( a ) 425 °C; ( b ) 475 °C; ( c ) 525 °C; ( d ) 575 °C; ( e ) 625 °C; ( f ) proportion of HAGBs.

    Journal: Materials

    Article Title: Effect of Tempering Temperature on Microstructural Evolution and Mechanical Properties of Cr-Ni-Mo-V Steel for Pressure Vessel Applications

    doi: 10.3390/ma19091679

    Figure Lengend Snippet: EBSD microstructures of Cr-Ni-Mo-V steel at different tempering temperatures: ( a ) 425 °C; ( b ) 475 °C; ( c ) 525 °C; ( d ) 575 °C; ( e ) 625 °C; ( f ) proportion of HAGBs.

    Article Snippet: For orientation and grain boundary analysis, specimens were electropolished in a 5% perchloric acid–ethanol solution at 15 V for 50 s. The crystal orientation and grain boundary distribution of the experimental steel were analyzed by means of an electron backscatter diffraction (EBSD) detector (EDAX Velocity Super) (EDAX LLC, Mahwah, NJ, USA), and the data acquisition step was 0.2 μm.

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